unleashed-firmware/applications/debug/unit_tests/varint/varint_test.c
SG b9a766d909 [FL-2627] Flipper applications: SDK, build and debug system (#1387)
* Added support for running applications from SD card (FAPs - Flipper Application Packages)
* Added plugin_dist target for fbt to build FAPs
* All apps of type FlipperAppType.EXTERNAL and FlipperAppType.PLUGIN are built as FAPs by default
* Updated VSCode configuration for new fbt features - re-deploy stock configuration to use them
* Added debugging support for FAPs with fbt debug & VSCode
* Added public firmware API with automated versioning

Co-authored-by: hedger <hedger@users.noreply.github.com>
Co-authored-by: SG <who.just.the.doctor@gmail.com>
Co-authored-by: あく <alleteam@gmail.com>
2022-09-15 02:21:03 +09:00

88 lines
2.8 KiB
C

#include <furi.h>
#include <furi_hal.h>
#include "../minunit.h"
#include <toolbox/varint.h>
#include <toolbox/profiler.h>
MU_TEST(test_varint_basic_u) {
mu_assert_int_eq(1, varint_uint32_length(0));
mu_assert_int_eq(5, varint_uint32_length(UINT32_MAX));
uint8_t data[8] = {};
uint32_t out_value;
mu_assert_int_eq(1, varint_uint32_pack(0, data));
mu_assert_int_eq(1, varint_uint32_unpack(&out_value, data, 8));
mu_assert_int_eq(0, out_value);
mu_assert_int_eq(5, varint_uint32_pack(UINT32_MAX, data));
mu_assert_int_eq(5, varint_uint32_unpack(&out_value, data, 8));
mu_assert_int_eq(UINT32_MAX, out_value);
}
MU_TEST(test_varint_basic_i) {
mu_assert_int_eq(5, varint_int32_length(INT32_MIN / 2));
mu_assert_int_eq(1, varint_int32_length(0));
mu_assert_int_eq(5, varint_int32_length(INT32_MAX / 2));
mu_assert_int_eq(2, varint_int32_length(127));
mu_assert_int_eq(2, varint_int32_length(-127));
uint8_t data[8] = {};
int32_t out_value;
mu_assert_int_eq(1, varint_int32_pack(0, data));
mu_assert_int_eq(1, varint_int32_unpack(&out_value, data, 8));
mu_assert_int_eq(0, out_value);
mu_assert_int_eq(2, varint_int32_pack(127, data));
mu_assert_int_eq(2, varint_int32_unpack(&out_value, data, 8));
mu_assert_int_eq(127, out_value);
mu_assert_int_eq(2, varint_int32_pack(-127, data));
mu_assert_int_eq(2, varint_int32_unpack(&out_value, data, 8));
mu_assert_int_eq(-127, out_value);
mu_assert_int_eq(5, varint_int32_pack(INT32_MAX, data));
mu_assert_int_eq(5, varint_int32_unpack(&out_value, data, 8));
mu_assert_int_eq(INT32_MAX, out_value);
mu_assert_int_eq(5, varint_int32_pack(INT32_MIN / 2 + 1, data));
mu_assert_int_eq(5, varint_int32_unpack(&out_value, data, 8));
mu_assert_int_eq(INT32_MIN / 2 + 1, out_value);
}
MU_TEST(test_varint_rand_u) {
uint8_t data[8] = {};
uint32_t out_value;
for(size_t i = 0; i < 200000; i++) {
uint32_t rand_value = rand();
mu_assert_int_eq(
varint_uint32_pack(rand_value, data), varint_uint32_unpack(&out_value, data, 8));
mu_assert_int_eq(rand_value, out_value);
}
}
MU_TEST(test_varint_rand_i) {
uint8_t data[8] = {};
int32_t out_value;
for(size_t i = 0; i < 200000; i++) {
int32_t rand_value = rand() + (INT32_MIN / 2 + 1);
mu_assert_int_eq(
varint_int32_pack(rand_value, data), varint_int32_unpack(&out_value, data, 8));
mu_assert_int_eq(rand_value, out_value);
}
}
MU_TEST_SUITE(test_varint_suite) {
MU_RUN_TEST(test_varint_basic_u);
MU_RUN_TEST(test_varint_basic_i);
MU_RUN_TEST(test_varint_rand_u);
MU_RUN_TEST(test_varint_rand_i);
}
int run_minunit_test_varint() {
MU_RUN_SUITE(test_varint_suite);
return MU_EXIT_CODE;
}